Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2006-04-04
2006-04-04
Chen, Kin-Chan (Department: 1765)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S714000
Reexamination Certificate
active
07022615
ABSTRACT:
A plasma processing method for processing a surface of an object to be processed made of a metal or a semiconductor by applying activated particles generated by a microplasma generated at a pressure of not lower than 10,000 Pa and not higher than three atmospheric pressures to the surface of the object, the method includes removing a natural oxide film on the surface of the object, and etching a part or whole of a region in which the natural oxide film has been removed.
REFERENCES:
patent: 5824455 (1998-10-01), Komatsu et al.
patent: 5981001 (1999-11-01), Komatsu et al.
patent: 6025115 (2000-02-01), Komatsu et al.
patent: 6506665 (2003-01-01), Sato
patent: 6743727 (2004-06-01), Mathad et al.
patent: 2004-146773 (2004-05-01), None
Okumura Tomohiro
Saitoh Mitsuo
Chen Kin-Chan
Wenderoth , Lind & Ponack, L.L.P.
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