Surface inspection system

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Details

C356S237400

Reexamination Certificate

active

07046353

ABSTRACT:
A surface inspection system for projecting a laser beam to a surface of a substrate and for detecting a foreign object by detecting scattered reflection light of the laser beam, comprising a light source unit having a plurality of light emitting sources for emitting the laser beams, and a projecting optical system for projecting the laser beam from each of the light emitting sources to the surface of the substrate.

REFERENCES:
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patent: 6122048 (2000-09-01), Cochran et al.
patent: 6621571 (2003-09-01), Maeda et al.
patent: 2003/0095251 (2003-05-01), Maeda et al.
patent: 5-273142 (1993-10-01), None
patent: 7-243988 (1995-09-01), None
patent: 9-161304 (1997-06-01), None
patent: 11-160245 (1999-06-01), None
patent: 2001-281162 (2001-10-01), None

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