Method for determining fringing capacitances on passive...

Details Method for determining fringing capacitances on passive... Method for determining fringing capacitances on passive...

2006-09-05

2006-09-05

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S117000

Reexamination Certificate

active

07103488

ABSTRACT:
A method for detemiining fringing capacitances on passive devices within an integrated circuit is disclosed. A fringing capacitance region on a passive device is initially divided into a group of fringing electric field areas. A set of fringing capacitance equations is then developed for the fringing electric field areas accordingly. A determination is made as to whether or not an accuracy of the fringing capacitance equations meets a predetermined threshold. If so, then the fringing capacitance equations are utilized in compact device models to determine fringing capacitance on the passive device; otherwise, the physically-based fringing capacitance equations are fitted to a set of extracted data to generate a refined set of physically-based fringing capacitance equations, and the refined set of physically-based fringing capacitance equations is utilized in compact device models to determine fringing capacitance on the passive device.

REFERENCES:
patent: 2002/0007258 (2002-01-01), Tsai
patent: 2004/0251513 (2004-12-01), Su et al.

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