Method for calibrating and de-embedding, set of devices for...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters

Reexamination Certificate

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C324S601000, C702S085000

Reexamination Certificate

active

07071707

ABSTRACT:
Consistent with an example embodiment, there is a method for calibrating an N terminal microwave measurement network. The method including the measurement of network parameter values of a load device depends on the knowledge of the parasitic impedance of the load device. According to the example embodiment, the accuracy of the method is improved by at least approximately determining the parasitic impedances of the load device. This may be achieved by measuring network parameter values of an auxiliary open device, having substantially identical parasitic impedance as that of the load device. The accuracy is further increased by measuring network parameter values of an auxiliary short device, having substantially identical parasitic impedance as that of the load device. A similar principle can be used for de-embedding a device under test. A load device, an auxiliary open device and an auxiliary short device each having substantially identical parasitic impedances are disclosed.

REFERENCES:
patent: 5847967 (1998-12-01), Asao
patent: 6249128 (2001-06-01), Begg
patent: 6643597 (2003-11-01), Dunsmore
patent: 6744262 (2004-06-01), Adamian
patent: 6832170 (2004-12-01), Martens
patent: 6895343 (2005-05-01), Jacobsen et al.
patent: 7019535 (2006-03-01), Adamian
patent: 2004/0201383 (2004-10-01), Anderson

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