Measuring and testing – With fluid pressure
Reexamination Certificate
2006-03-21
2006-03-21
Eashoo, Mark (Department: 1732)
Measuring and testing
With fluid pressure
C073S760000, C073S788000, C073S864010
Reexamination Certificate
active
07013709
ABSTRACT:
A rapid throughput method for the preparation, analysis or both of libraries of material samples is provided. According to the method, a plurality of samples is provided. The plurality of samples is then formed into a plurality of films. Thereafter, the plurality of films is plastically deformed. Preferably, the plurality of films is deformed into a configuration appropriate for testing of properties or characteristics of the samples.
REFERENCES:
patent: 1870412 (1932-08-01), Kennedy
patent: 2590839 (1952-04-01), Clapham
patent: 2786352 (1957-03-01), Sobota
patent: 3071961 (1963-01-01), Heigl et al.
patent: 3151483 (1964-10-01), Plummer
patent: 3613445 (1971-10-01), Dent et al.
patent: 3618372 (1971-11-01), Beckstrom
patent: 3675475 (1972-07-01), Weinstein
patent: 3713328 (1973-01-01), Aritomi
patent: 3798960 (1974-03-01), Glass
patent: 3805598 (1974-04-01), Corcoran
patent: 3818751 (1974-06-01), Karper et al.
patent: 3835697 (1974-09-01), Schneider et al.
patent: 3849874 (1974-11-01), Jeffers
patent: 3895513 (1975-07-01), Richardson
patent: 3908441 (1975-09-01), Virloget
patent: 3933032 (1976-01-01), Tschoegl
patent: 4229979 (1980-10-01), Greenwood
patent: 4447125 (1984-05-01), Lazay et al.
patent: 4517830 (1985-05-01), Gunn et al.
patent: 4567774 (1986-02-01), Manahan et al.
patent: 4570478 (1986-02-01), Soong
patent: 4599219 (1986-07-01), Cooper et al.
patent: 4602501 (1986-07-01), Hirata
patent: 4605589 (1986-08-01), Orphanides
patent: 4680958 (1987-07-01), Ruelle et al.
patent: 4685328 (1987-08-01), Huebner et al.
patent: 4699000 (1987-10-01), Lashmore et al.
patent: 4715007 (1987-12-01), Fujita et al.
patent: 4740078 (1988-04-01), Daendliker et al.
patent: 4749854 (1988-06-01), Martens
patent: 4789236 (1988-12-01), Hodor et al.
patent: 4793174 (1988-12-01), Yau
patent: 4829837 (1989-05-01), Telfer
patent: 4893500 (1990-01-01), Fink-Jensen
patent: 4899575 (1990-02-01), Chu et al.
patent: 4899581 (1990-02-01), Allen et al.
patent: 4926682 (1990-05-01), Holm-Kennedy et al.
patent: 4932270 (1990-06-01), Lurie et al.
patent: 4975320 (1990-12-01), Goldstein et al.
patent: 5008081 (1991-04-01), Blau et al.
patent: 5051239 (1991-09-01), von der Goltz
patent: 5092179 (1992-03-01), Ferguson
patent: 5115669 (1992-05-01), Fuller et al.
patent: 5142900 (1992-09-01), Duke
patent: 5193383 (1993-03-01), Burnham et al.
patent: 5236998 (1993-08-01), Lundeen et al.
patent: 5269190 (1993-12-01), Kramer et al.
patent: 5271266 (1993-12-01), Eschbach
patent: 5272912 (1993-12-01), Katsuzaki
patent: 5280717 (1994-01-01), Hoseney et al.
patent: 5303030 (1994-04-01), Abraham et al.
patent: 5305633 (1994-04-01), Weissenbacher et al.
patent: 5398885 (1995-03-01), Andersson et al.
patent: 5437192 (1995-08-01), Kawamoto et al.
patent: 5438863 (1995-08-01), Johnson
patent: 5452614 (1995-09-01), Kato et al.
patent: 5452619 (1995-09-01), Kawanabe et al.
patent: 5481153 (1996-01-01), Turner
patent: 5517860 (1996-05-01), Lin et al.
patent: 5520042 (1996-05-01), Garritano et al.
patent: 5532942 (1996-07-01), Kitamura et al.
patent: 5610325 (1997-03-01), Rajagopal et al.
patent: 5614662 (1997-03-01), Hallan et al.
patent: 5626779 (1997-05-01), Okada
patent: 5699159 (1997-12-01), Mason
patent: 5700953 (1997-12-01), Hlady et al.
patent: 5723792 (1998-03-01), Miyazaki
patent: 5728532 (1998-03-01), Ackley
patent: 5756883 (1998-05-01), Forbes
patent: 5764068 (1998-06-01), Katz et al.
patent: 5776359 (1998-07-01), Schultz et al.
patent: 5795989 (1998-08-01), Simmons et al.
patent: 5817947 (1998-10-01), Bergerus
patent: 5821407 (1998-10-01), Sekiguchi et al.
patent: 5847283 (1998-12-01), Finot et al.
patent: 5877428 (1999-03-01), Scolton
patent: 5892157 (1999-04-01), Syre
patent: 5922967 (1999-07-01), Motoyama
patent: 5959297 (1999-09-01), Weinberg et al.
patent: 5985356 (1999-11-01), Schultz et al.
patent: 5999887 (1999-12-01), Giannakopoulos et al.
patent: 6004617 (1999-12-01), Schultz et al.
patent: 6010616 (2000-01-01), Lewis et al.
patent: 6013199 (2000-01-01), McFarland et al.
patent: 6030917 (2000-02-01), Weinberg et al.
patent: 6033913 (2000-03-01), Morozov et al.
patent: 6034240 (2000-03-01), La Pointe
patent: 6034775 (2000-03-01), McFarland et al.
patent: 6040193 (2000-03-01), Winkler et al.
patent: 6043317 (2000-03-01), Mumick et al.
patent: 6043363 (2000-03-01), LaPointe et al.
patent: 6045671 (2000-04-01), Wu et al.
patent: 6050138 (2000-04-01), Lynch et al.
patent: 6050139 (2000-04-01), Bousfield et al.
patent: 6087181 (2000-07-01), Cong
patent: 6092414 (2000-07-01), Newman
patent: 6124476 (2000-09-01), Guram et al.
patent: 6149882 (2000-11-01), Guan et al.
patent: 6151123 (2000-11-01), Nielsen
patent: 6157449 (2000-12-01), Hajduk
patent: 6175409 (2001-01-01), Nielsen et al.
patent: 6177528 (2001-01-01), LaPointe et al.
patent: 6182499 (2001-02-01), McFarland et al.
patent: 6187164 (2001-02-01), Warren et al.
patent: 6203726 (2001-03-01), Danielson et al.
patent: 6225487 (2001-05-01), Guram
patent: 6225550 (2001-05-01), Hornbostel et al.
patent: 6230548 (2001-05-01), Han et al.
patent: 6242623 (2001-06-01), Boussie et al.
patent: 6248540 (2001-06-01), Weinberg et al.
patent: 6260407 (2001-07-01), Petro et al.
patent: 6265226 (2001-07-01), Petro et al.
patent: 6265601 (2001-07-01), Guram et al.
patent: 6267011 (2001-07-01), Kurtz et al.
patent: 6268513 (2001-07-01), Guram et al.
patent: 6294388 (2001-09-01), Petro
patent: 6296771 (2001-10-01), Miroslav
patent: 6306658 (2001-10-01), Turner et al.
patent: 6315923 (2001-11-01), Devenney et al.
patent: 6321594 (2001-11-01), Brown et al.
patent: 6326090 (2001-12-01), Schultz et al.
patent: 6336353 (2002-01-01), Matsiev et al.
patent: 6371640 (2002-04-01), Hajduk et al.
patent: 6393898 (2002-05-01), Hajduk et al.
patent: 6438497 (2002-08-01), Mansky et al.
patent: 6650102 (2003-11-01), Hajduk et al.
patent: 6690179 (2004-02-01), Hajduk et al.
patent: 6772642 (2004-08-01), Hajduk et al.
patent: 2112792 (1994-07-01), None
patent: 0 317 356 (1989-05-01), None
patent: 0 406 413 (1991-01-01), None
patent: 1 158 290 (2001-11-01), None
patent: 401229934 (1989-09-01), None
patent: 402297040 (1990-12-01), None
patent: WO 96/11878 (1996-04-01), None
patent: WO 98/15501 (1998-04-01), None
patent: WO 99/18431 (1999-04-01), None
patent: WO 00/17413 (2000-03-01), None
patent: WO 00/23921 (2000-04-01), None
patent: WO 00/36410 (2000-06-01), None
patent: WO 00/40331 (2000-07-01), None
patent: WO 00/51720 (2000-09-01), None
patent: WO 00/67086 (2000-11-01), None
patent: WO 01/79949 (2001-10-01), None
U.S. Appl. No. 09/939,404 entitled “High Throughput Mechanical Property and Bulge Testing of Material Libraries,” (D. Hajduk et al.) filed on Aug. 24, 2001.
U.S. Appl. No. 09/939,252 entitled “High Throughput Mechanical Rapid Serial Property Testing of Material Libraries,” (P. Mansky) filed on Aug. 24, 2001.
U.S. Appl. No. 09/939,139 entitled “High Throughput Fabric Handle Screening,” (M. Kossuth et al.) filed on Aug. 24, 2001.
U.S. Appl. No. 09/939,149 entitled “High Throughput Rheological Testing of Materials,” (P. Mansky et al.) filed on Aug. 24, 2001.
U.S. Appl. No. 09/939,263 entitled “High Throughput Mechanical Property Testing of Materials Libraries Using Capacitance,” (D. Hajduk et al.) filed on Aug. 24, 2001.
The family of applications for U.S. Appl. No. 09/580,024 entitled “Instrument for High Throughput Measurement of Material Physical Properties and Method of Using Same,” (Carlson, et al.) filed on May 26, 2000.
U.S. Appl. No. 09/938,994 entitled “High Throughput Mechanical Property Testing of Material Libraries Using a Piezoelectric,” (D. Hajduk) filed on Aug. 24, 2001.
U.S. Provisional Patent Appl. No. 60/371,357 filed on Apr. 10, 2002.
U.S. Appl. No. 10/133,938 filed Apr. 26, 2002.
U.S. Appl. No. 10/225,942 filed Aug. 22, 2002.
U.S. Appl. No. 10/291,108 filed Nov. 8, 2002.
U.S. Appl. No. 09/420,334 entitled “Graphic Design of Combinatorial Material Libraries” (Lacy, et al.) filed on Oct. 18, 1999.
U.S. Appl. No. 09/305,830 titled “Synthesizing Co
Hajduk Damian A.
Kolosov Oleg
Dobrusin & Thennisch PC
Eashoo Mark
Symyx Technologies Inc.
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