Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-03-28
2006-03-28
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S069000, C702S079000, C702S190000, C702S191000
Reexamination Certificate
active
07020568
ABSTRACT:
A method generating wander noise includes predefining frequency, amplitude and phase values for each of a plurality of tones for various predefined frequency profiles. A digital noise signal having a particular profile can then be generated by a summation of a plurality of tones based on the predefined frequency, amplitude and phase values for each of the plurality of tones for the selected profile. The wander noise signal is then generated from the digital noise signal.
REFERENCES:
patent: 5631920 (1997-05-01), Hardin
patent: 6687319 (2004-02-01), Perino et al.
patent: 0828343 (1998-03-01), None
patent: 1152562 (2001-11-01), None
patent: 1164696 (2001-12-01), None
patent: 1167985 (2002-01-01), None
Agilent Technologie,s Inc.
Bui Bryan
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