Radiant energy – Ionic separation or analysis
Reexamination Certificate
2006-03-21
2006-03-21
Lee, John R. (Department: 2881)
Radiant energy
Ionic separation or analysis
C250S288000
Reexamination Certificate
active
07015461
ABSTRACT:
An apparatus for ion attachment mass spectrometry provided with an ion emitter for emitting positively charged metal ions, an ionization chamber for causing attachment of the metal ions to a gas to be detected, a third component gas introduction mechanism for introducing a third component gas into the ionization chamber, and a mass spectrometer for mass separation and detection of the detected gas with the metal ions attached. The third component gas introduction mechanism is provided with three types of third component gases and selectively introduces one type of third component gas from the three types of third component gases. Due to this, the occurrence of interference peaks due to macromers of third component gases with each other, macromers of third component gases and high concentration ingredients, etc. is prevented and accurate mass analysis made possible.
REFERENCES:
patent: 4948962 (1990-08-01), Mitsui et al.
patent: 5194739 (1993-03-01), Sato et al.
patent: 6008490 (1999-12-01), Kato
patent: 6326616 (2001-12-01), Andrien et al.
patent: 6566652 (2003-05-01), Kato
patent: 6744041 (2004-06-01), Sheehan et al.
R. V. Hodges et al.. “Application of Alkali Ions in Chemical Ionization Mass Spectrometry”,Analytic Chemistry, vol. 48, No. 6, pp. 825-829. (1976).
D. Bombick et al., “Potassium Ion Chemical Ionization and Other Uses of an Alkali Thermionic Emitter in Mass Spectrometry”,Analytical Chemistry, vol. 56, No. 3, pp. 396-402, (1984).
Toshihiro Fujii et al., “Chemical Ionization Mass Spectrometry with Lithium Ion Attachment to the Molecule”,Analytical Chemistry, vol. 61, No. 9, pp. 1026-1029, (1989).
Toshihiro Fujii. “A Novel Method for Detection of Radical Species in the Gas Phase: Usage of L i Ion Attachment to Chemical Species”,Chemical Physics Letters, vol. 191, No. 1.2, pp. 162-168, (1992).
Japanese Patent Abstracts of JP-A-06-011485.
Fujii Toshihiro
Nakamura Megumi
Sasaki Tohru
Shiokawa Yoshiro
Anelva Corporation
Johnston Phillip A
Lee John R.
Oliff & Berridg,e PLC
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