Timing generator and semiconductor test apparatus

Details Timing generator and semiconductor test apparatus Timing generator and semiconductor test apparatus

2006-04-25

2006-04-25

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S765010

Reexamination Certificate

active

07034518

ABSTRACT:
There is provided a timing generator capable of absorbing a delay time error of a variable delay circuit without increasing the number of bits of path data and suppressing deterioration of the timing accuracy from the designed value to the minimum. The timing generator is configured to include a selection unit which assigns five-bit delay device candidates to a three-bit partial bit signal of all the bit signals constituting the path data outputted from a linearization memory and selects three delay devices whose number is equal to the bit count of the partial bit signal.

REFERENCES:
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patent: 6377065 (2002-04-01), Le et al.
patent: 6479983 (2002-11-01), Ebiya
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patent: 05-240919 (1993-09-01), None
patent: 06-196958 (1994-07-01), None
patent: 2000-131401 (2000-05-01), None
patent: 2000-332583 (2000-11-01), None

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