Vehicle fenders – Buffer or bumper type – Bumper having impact force absorbing means directly...
Reexamination Certificate
2006-04-18
2006-04-18
Pape, Joseph D. (Department: 3612)
Vehicle fenders
Buffer or bumper type
Bumper having impact force absorbing means directly...
C296S187090, C267S175000
Reexamination Certificate
active
07029044
ABSTRACT:
An impact absorbing device for a vehicle uses a shape memory material that can be heated to repair deformation from a relatively low speed, low energy impact and its stroking force and energy absorption can be tuned by heating. The shape memory material is suitably used in a crash box having an inserted impact absorbing ram, the box being placed, for example, between a bumper and strong body member. The shape memory material is attached to the box and ram for absorbing energy as the ram is driven into the box. Electric resistance heating may be used to repair or tune the shape memory material.
REFERENCES:
patent: 3174851 (1965-03-01), Buehler
patent: 3403238 (1968-09-01), Buehler et al.
patent: 3788626 (1974-01-01), Isaacson
patent: 4304613 (1981-12-01), Wang et al.
patent: 5189110 (1993-02-01), Ikematu et al.
patent: 6050624 (2000-04-01), Kim
patent: 6530564 (2003-03-01), Julien
patent: 6910714 (2005-06-01), Browne et al.
G. Kauffman & Isaac Mayo, The Metal with a Memory, Invention & Technology—Fall 1993, pp. 19-23.
Shape Memory Applications, Inc., Selected Properties of NiTi, Copyright 1999, pp. 1-2.
Memry Corporation, Nitinol Product Information, http://www.memry.com/products.htm, pp. 1-5.
Browne Alan L.
Johnson Nancy L.
Kramarczyk Mark A.
General Motors Corporation
Marra Kathryn A.
Pape Joseph D.
LandOfFree
Tunable, healable vehicle impact devices does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Tunable, healable vehicle impact devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Tunable, healable vehicle impact devices will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3584757