Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate
2006-07-18
2006-07-18
Jackson, Jerome (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified material other than unalloyed aluminum
C257S762000
Reexamination Certificate
active
07078811
ABSTRACT:
There are provided a semiconductor device and method for fabricating the device capable of achieving reliable electrical connection by securely directly bonding conductors to each other even though bonding surfaces are polished by a CMP method and solid-state-bonded to each other. By polishing according to the CMP method, a through hole conductor5and a grounding wiring layer10, which are made of copper, become concave in a dish-like shape and lowered in level, causing a dishing portion17since they have a hardness lower than that of a through hole insulator11made of silicon nitride. The through hole insulator11is selectively etched by a reactive ion etching method until the through hole insulator11comes to have a height equal to the height of a bottom portion19of the dishing portion17of the through hole conductor5. The through hole conductors5and25are aligned with each other, and the bonding surfaces12and22are bonded to each other in a solid state bonding manner.
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U.S. Appl. No. 09/548,916, filed Apr. 13, 2000, entitled “Semiconductor Device and Manufacturing Method Therefor”.
Jackson Jerome
Nguyen Joseph
Nixon & Vanderhye P.C.
Sharp Kabushiki Kaisha
Suga Tadatomo
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