Semiconductor device and method for fabricating the device

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Reexamination Certificate

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C257S762000

Reexamination Certificate

active

07078811

ABSTRACT:
There are provided a semiconductor device and method for fabricating the device capable of achieving reliable electrical connection by securely directly bonding conductors to each other even though bonding surfaces are polished by a CMP method and solid-state-bonded to each other. By polishing according to the CMP method, a through hole conductor5and a grounding wiring layer10, which are made of copper, become concave in a dish-like shape and lowered in level, causing a dishing portion17since they have a hardness lower than that of a through hole insulator11made of silicon nitride. The through hole insulator11is selectively etched by a reactive ion etching method until the through hole insulator11comes to have a height equal to the height of a bottom portion19of the dishing portion17of the through hole conductor5. The through hole conductors5and25are aligned with each other, and the bonding surfaces12and22are bonded to each other in a solid state bonding manner.

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U.S. Appl. No. 09/548,916, filed Apr. 13, 2000, entitled “Semiconductor Device and Manufacturing Method Therefor”.

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