Method of manufacturing a substrate for an electronic device...

Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching

Reexamination Certificate

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C438S745000, C438S508000

Reexamination Certificate

active

07101809

ABSTRACT:
In the case that a stacked layer, in which another metal layer is stacked on an Al layer or Al alloy layer having a low resistance, is used as a wiring material, an etchant is provided which can etch to a substantially equal etching rate by executing only one etching on the each metal layer composing the stacked layer. A method of manufacturing a substrate for an electronic device uses the etchant, producing an electronic device having the substrate.In order to achieve the object, the etchant has fluoric acid, periodic acid and sulfuric acid wherein the total weight ratio of the fluoric acid and periodic acid is 0.05˜30 wt %, the weight ratio of the sulfuric acid is 0.05˜20 wt %, the weight ratio of periodic acid to fluoric acid is 0.01˜2 wt %. Also each layer of wiring (5, 12, 14) formed by stacking Al layer or Al alloy layer and Ti layer or Ti alloy layer can be uniformly etched to substantially equal etching rate by the etchant.

REFERENCES:
patent: 4107726 (1978-08-01), Schilling
patent: 4220706 (1980-09-01), Spak
patent: 4900398 (1990-02-01), Chen
patent: 5010027 (1991-04-01), Possin et al.
patent: 5102499 (1992-04-01), Jodgens et al.
patent: 5153754 (1992-10-01), Whetten
patent: 5300463 (1994-04-01), Cathey et al.
patent: 5409569 (1995-04-01), Seki et al.
patent: 5498573 (1996-03-01), Whetten
patent: 5591480 (1997-01-01), Weisman et al.
patent: 5648277 (1997-07-01), Zhang et al.
patent: 5652083 (1997-07-01), Kumar et al.
patent: 5696386 (1997-12-01), Yamazaki
patent: 5714407 (1998-02-01), Maeno et al.
patent: 5731856 (1998-03-01), Kim et al.
patent: 5737053 (1998-04-01), Yomogihara et al.
patent: 5867242 (1999-02-01), Yao et al.
patent: 6069158 (2000-05-01), Miller et al.
patent: 6081308 (2000-06-01), Jeong et al.
patent: 6117783 (2000-09-01), Small et al.
patent: 6140233 (2000-10-01), Kwag et al.
patent: 6177026 (2001-01-01), Wang et al.
patent: 6193815 (2001-02-01), Wada et al.
patent: 6197150 (2001-03-01), Kwang et al.
patent: 6232228 (2001-05-01), Kwag et al.
patent: 6262702 (2001-07-01), Murade
patent: 6369410 (2002-04-01), Yamazaki et al.
patent: 6461978 (2002-10-01), Jo
patent: 199 28 570 (1999-12-01), None
patent: 0 534 240 (1993-03-01), None
patent: 55054573 (1980-04-01), None
patent: 56029324 (1981-03-01), None
patent: 06151904 (1994-05-01), None
S. Wolf et al., “Silicon Processing for the VSLI Era”, vol. 1, Lattice Press, 1986 p. 529.
Henry G. Hughes et al., “Proceedings of the Symposium on Etching for Pattern Definition”; The Electrochemical Society, Dielectrics and Insulation and Electronics Division, pp. 76-91.
Kelly, J. J. and Koel, G. J.; “Galvanic Effects in the Wet-Chemical Etching of Metal Films”; Philips Technical Review, vol. 38, 1978/79, No. 6; pp. 10-18.

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