Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Calibration
Reexamination Certificate
2006-05-02
2006-05-02
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Calibration
C324S076550, C703S019000
Reexamination Certificate
active
07038466
ABSTRACT:
Method and apparatus for determining delay of a circuit. A clock signal is provided to a variable delay and then to the circuit. The clock signal obtained from the circuit is provided to a data register, such as a flip-flop, as a clock input. The clock signal is provided to the flip-flop as a data input. Output of the data register is provided to a controller to incrementally adjust phase shift until the data input and clock input are substantially aligned in phase. All incremental adjustments in phase shift are counted to provide an indication of delay of the circuit.
REFERENCES:
patent: 6788594 (2004-09-01), Ware et al.
patent: 6812727 (2004-11-01), Kobayashi
patent: 2001/0014851 (2001-08-01), Krishnamoorthy
patent: 2003/0001650 (2003-01-01), Cao et al.
Nguyen Vincent Q.
Webostad W. Eric
Xilinx , Inc.
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