Testing arrangement for optical devices

Details Testing arrangement for optical devices Testing arrangement for optical devices

2006-01-24

2006-01-24

Lee, Hwa Andrew (Department: 2877)

Optics: measuring and testing

By light interference

Using fiber or waveguide interferometer

C356S450000

Reexamination Certificate

active

06989902

ABSTRACT:
A measuring setup for measuring an optical device under test—DUT—includes an optical signal source for applying an optical signal to the DUT, and an optical receiver unit for measuring a response of the DUT on the applied signal. A measurement unit is coupled between the optical signal source and the optical receiver unit. The measurement unit comprises an optical circuit to provide optical signals from and/or to the DUT for measuring the DUT, whereby the optical circuit comprises optical components showing high susceptibility to mechanical noise. A shielding unit receives the optical circuit and provides at least partial shielding of the optical circuit and/or the DUT against mechanical noise.

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Zafiropoulos, N. Examiner, European Search Report Application No. EP 01 11 7060 dated Dec. 12, 2001.

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