Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-07-18
2006-07-18
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S065000, C702S191000, C324S141000, C324S142000, C455S067110
Reexamination Certificate
active
07079961
ABSTRACT:
A test system and method having a test channel and an additional channel, and wherein the ratio of amplitude and phase between the interference current through the device under test and the interference signal on the additional channel are determined. The system further applies a voltage at or near line frequency to the device under test, and then continuously subtracts the additional interference signal from the current signal through the device under test. In doing so, the system and method allows accurate measurements of the real and reactive power of an impedance at or very close to the line frequency.
REFERENCES:
patent: 3842344 (1974-10-01), Povey
patent: 3936730 (1976-02-01), Pittman
patent: 4384366 (1983-05-01), Kaitsuka
patent: 4472676 (1984-09-01), Eichmann et al.
patent: 4851761 (1989-07-01), Matsuno
patent: 4857830 (1989-08-01), Matsuno
patent: 4857855 (1989-08-01), Matsuno
patent: 5101160 (1992-03-01), Barjonnet et al.
patent: 5469066 (1995-11-01), Ito et al.
patent: 5475709 (1995-12-01), Futagami et al.
patent: 5481198 (1996-01-01), Patel
patent: 5559439 (1996-09-01), Bergeal
patent: 5587662 (1996-12-01), Kelley et al.
patent: 5818245 (1998-10-01), Allfather
patent: 5990687 (1999-11-01), Williams
patent: 6114983 (2000-09-01), Ghose et al.
patent: 6177803 (2001-01-01), Train et al.
patent: 6812716 (2004-11-01), Fawcett
patent: 2002/0024342 (2002-02-01), Bussinger
patent: 2003/0085715 (2003-05-01), Lubkeman et al.
patent: 2003/0160602 (2003-08-01), Anand et al.
patent: 0 600 726 (1994-06-01), None
patent: 52016255 (1977-02-01), None
patent: 57149972 (1982-09-01), None
'Hubbell Incorporated
Barbee Manuel L.
Bicks Mark S.
Goodman Alfred N.
Grubb Ronald
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