Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-03-21
2006-03-21
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S761010
Reexamination Certificate
active
07015707
ABSTRACT:
Described are probes, designed to make electrical contact with high-density chips or similar electronic devices. Two groups of probes are covered. The first group includes probes that are moved laterally, parallel to the surface of the contact pads of the device under test, after the initial contact has been made. This is to create the desired wipe or scrub. The second group includes probes that operate on the principle of suction cups. When the probe is pushed against the device under test, the probe lips stretch outwardly and create the desirable wipe or scrub.
REFERENCES:
patent: 4918383 (1990-04-01), Huff et al.
patent: 4980637 (1990-12-01), Huff et al.
patent: 5914613 (1999-06-01), Gleason et al.
patent: 6507207 (2003-01-01), Nguyen
Nguyen Tung X.
Nguyen Vinh
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