Micro probe

Details Micro probe Micro probe

2006-03-21

2006-03-21

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010

Reexamination Certificate

active

07015707

ABSTRACT:
Described are probes, designed to make electrical contact with high-density chips or similar electronic devices. Two groups of probes are covered. The first group includes probes that are moved laterally, parallel to the surface of the contact pads of the device under test, after the initial contact has been made. This is to create the desired wipe or scrub. The second group includes probes that operate on the principle of suction cups. When the probe is pushed against the device under test, the probe lips stretch outwardly and create the desirable wipe or scrub.

REFERENCES:
patent: 4918383 (1990-04-01), Huff et al.
patent: 4980637 (1990-12-01), Huff et al.
patent: 5914613 (1999-06-01), Gleason et al.
patent: 6507207 (2003-01-01), Nguyen

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