Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-05-09
2006-05-09
Assouad, Patrick J. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S520000, C324S521000, C702S065000, C702S057000
Reexamination Certificate
active
07043379
ABSTRACT:
A method for quantifying effects of resonance in an integrated circuit's power distribution network is provided. The power distribution network includes a first power supply line and a second power supply line to provide power to the integrated circuit. Test ranges are selected for two test parameters, reference voltage potential of a receiver and data transmission frequency of the integrated circuit. At each combination of the two test parameters, bit patterns are transmitted by the integrated circuit to the receiver. A comparison is made between the transmitted bits and the received bits to determine whether the transmitted bits were correctly received. The comparison may be used to determine and report a range of values for the reference voltage potential and data transmission frequency that allow the transmitted bits to be correctly received.
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Amick Brian W.
Gauthier Claude R.
Roy Aninda K.
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