Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-05-02
2006-05-02
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C716S030000, C703S014000
Reexamination Certificate
active
07039536
ABSTRACT:
The invention provides a method of analyzing a source current at a higher speed and an enhanced accuracy in a semiconductor integrated circuit including a digital circuit. The method to analyze a waveform of the source current, with consideration of re-distribution of charges throughout the digital circuit in the semiconductor integrated circuit, expressing the digital circuit with series of parasitic capacitors ΣCch, ↑(nT) and ΣCch, ↓(nT) to be charged and connected between the source and the ground lines. The capacitor series are calculated in time series based on the distribution of switching operations of the logic gates included in the digital circuit. An analysis model for determining the waveform of the source current in the digital circuit is obtained by connecting the parasitic capacitor series with a couple of respective parasitic impedances Zdand Zgof the source line and the ground line.
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Table of Contents for the Proceedings of the IEEE 2000 Custom Integrated Circuits Conference, Orlando, Florida, May 21-24, 2000.
Iwata Atsushi
Nagata Makoto
Hoff Marc S.
McDermott Will & Emery LLP
Semiconductor Technology Academic Research Center
West Jeffrey R.
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