Shallow trench isolation (STI) region with high-K liner and...

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S436000, C438S435000, C438S437000

Reexamination Certificate

active

06984569

ABSTRACT:
A shallow trench isolation region formed in a layer of semiconductor material. The shallow trench isolation region includes a trench formed in the layer of semiconductor material, the trench being defined by sidewalls and a bottom; a liner within the trench formed from a high-K material, the liner conforming to the sidewalls and bottom of the trench; and a fill section made from isolating material, and disposed within and conforming to the high-K liner. A method of forming the shallow trench isolation region is also disclosed.

REFERENCES:
patent: 5811347 (1998-09-01), Gardner
patent: 5989978 (1999-11-01), Peidous
patent: 6008095 (1999-12-01), Gardner et al.
patent: 6013553 (2000-01-01), Wallace et al.
patent: 6020024 (2000-02-01), Maiti et al.
patent: 6074899 (2000-06-01), Voldman
patent: 6313008 (2001-11-01), Leung et al.
patent: 6313011 (2001-11-01), Nouri
patent: 6465866 (2002-10-01), Park et al.
patent: 6498383 (2002-12-01), Beyer
patent: 6657267 (2003-12-01), Xiang et al.
patent: 6657276 (2003-12-01), Karlsson et al.
patent: 6730576 (2004-05-01), Wang et al.
patent: 6747333 (2004-06-01), Xiang et al.
patent: 6762483 (2004-07-01), Krivokapic et al.
patent: 6784101 (2004-08-01), Yu et al.
patent: 6812119 (2004-11-01), Ahmed et al.
patent: 6828211 (2004-12-01), Chi
patent: 6882025 (2005-04-01), Yeo et al.
patent: 6894363 (2005-05-01), Tamura
patent: 2002/0053715 (2002-05-01), Kim et al.
patent: 2003/0067051 (2003-04-01), Tamura
patent: 2004/0121553 (2004-06-01), Tamura
patent: 2004/0142545 (2004-07-01), Ngo et al.
patent: 2004/0212035 (2004-10-01), Yeo et al.
patent: 2005/0035426 (2005-02-01), Ko et al.
patent: 2005/0073022 (2005-04-01), Karlsson et al.
patent: 0703628 (1996-03-01), None
patent: 2004119649 (2004-04-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Shallow trench isolation (STI) region with high-K liner and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Shallow trench isolation (STI) region with high-K liner and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Shallow trench isolation (STI) region with high-K liner and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3537740

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.