Optics: measuring and testing – Of light reflection
Reexamination Certificate
2006-01-31
2006-01-31
Rosenberger, Richard A. (Department: 2877)
Optics: measuring and testing
Of light reflection
Reexamination Certificate
active
06992770
ABSTRACT:
Disclosed herein is a sensor utilizing attenuated total reflection. The sensor includes a first dielectric block; a thin film layer, formed on a first face of the dielectric block, for placing a sample thereon; and a light source for emitting a light beam. The sensor further includes an optical incidence system for collimating the light beam, and making the collimated light beam enter the dielectric block at a predetermined incidence angle so that a condition for total internal reflection is satisfied at an interface between the dielectric block and the thin film layer; a photodetector for detecting the refractive index distribution of the sample obtained within a plane along the interface, by detecting an image carried by the light beam totally reflected at the interface; and an optical compensation system for compensating for image distortion produced by the dielectric block when the predetermined incidence angle of the light beam varies.
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Takayuki Okamoto, “Spectral Research” No. 1, pp. 21-23, pp. 26-27, vol. 47.
Fuji Photo Film Co. , Ltd.
Rosenberger Richard A.
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