Optics: measuring and testing – Of light reflection
Reexamination Certificate
2006-07-18
2006-07-18
Turner, Archene (Department: 1775)
Optics: measuring and testing
Of light reflection
C257S226000, C257S444000, C356S450000
Reexamination Certificate
active
07079250
ABSTRACT:
A plasmon resonance device100according to an example of a structure is characterized in that metallic particles7isolated from each other are formed in each of a plurality of pores5of anodic oxidized alumina3.As a method of manufacturing the plasmon resonance device100,a metal is coated on the anodic oxidized alumina3opening the pores5and a metal coated element provided on the opening surface of the pore in the anodic oxidized alumina3is removed. Consequently, metallic particles isolated from each other are formed in the respective independent pores. The plasmon resonance device100can be used as a sensor utilizing a localized plasmon resonance phenomenon.
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“Solid State Physics” vol. 31, No. 5 1996.
Fuji Photo Film Co. , Ltd.
Sughrue & Mion, PLLC
Turner Archene
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