Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-04-11
2006-04-11
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S247000
Reexamination Certificate
active
07027941
ABSTRACT:
In order to improve the speed of an electro-magnetic field intensity calculation process in a device capable of performing the cooperation process of a circuit analysis and an electro-magnetic wave analysis, the present invention comprises a determination unit2for determining whether a component constituting an electric circuit contained in an analysis target, an analysis processing unit3for analyzing an electro-magnetic wave emitted from the analysis target, using an analysis target model containing a linear component if all components are linear, and a cooperation process unit4for dividing the analysis target into a circuit analysis model to which a circuit analysis method should be applied, an electro-magnetic wave analysis model to which an electro-magnetic wave analysis should be applied and one or more ports for combining the two models and analyzing an electro-magnetic wave emitted from the analysis target, if one or more components are non-linear.
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Nagase Kenji
Ohtsu Shinichi
Yamagajo Takashi
Charioui Mohamed
Hoff Marc S.
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