Socket for testing a component and method of testing a...

Electrical connectors – Preformed panel circuit arrangement – e.g. – pcb – icm – dip,... – With provision to conduct electricity from panel circuit to...

Reexamination Certificate

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C439S073000

Reexamination Certificate

active

06908315

ABSTRACT:
A socket (1) for accommodating and testing a component (2) having several electrical connectors (3) is disclosed, which socket comprises a substantially rectangular frame (4) surrounding a space (5), which frame (4) includes a first row (6) and a second row (7) of electric conductors (8) which are arranged opposite one another, which conductors (8) have first section (9) with a terminal (10) extending into space (5) for contacting an electric connector (3) of the component (2), and a second section (11) projecting from the frame (4). The spacing (12) between the terminals (10) in each row (6, 7) is adjustable. In the method of testing a component (2) in the socket (1), the spacing (12) between the terminals (10) in each row (6, 7) is adjusted to establish electrical contact between the electrical connectors (3) of the component (2) and its corresponding terminal (10) by placing the component (2) in the socket (1).

REFERENCES:
patent: 4593961 (1986-06-01), Cosmo
patent: 4838799 (1989-06-01), Tonooka
patent: 5975915 (1999-11-01), Yamazaki et al.
patent: 6012929 (2000-01-01), Matsumura
patent: 6609923 (2003-08-01), Sato et al.
patent: 1263572 (1989-10-01), None
patent: 06082519 (1994-06-01), None

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