Position measuring device and method for determining a position

Details Position measuring device and method for determining a position Position measuring device and method for determining a position

2005-06-28

2005-06-28

Nghiem, Michael (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Orientation or position

Reexamination Certificate

active

06912476

ABSTRACT:
A method for position determination in a position measuring device that includes digitizing analog position data from a detector unit within time intervals of an internal clock rate and calculating position data from the digitized data. Determining a period of time Δt between a pulse of the internal clock until an appearance of an external trigger signal and a processing of at least two position data, together with the period of time Δt.

REFERENCES:
patent: 5391970 (1995-02-01), Chaffee et al.
patent: 6525538 (2003-02-01), Mercer
patent: 5-226232 (1993-09-01), None
Patent Abstracts of Japan document regarding Japanese publication 5,226232 A, published by Japanese Patent Office, Dec. 10, 1993, one page.

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