Semiconductor substrate made of group III nitride, and...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal

Reexamination Certificate

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C438S046000, C438S047000, C438S048000, C438S085000, C438S093000

Reexamination Certificate

active

06924159

ABSTRACT:
To provide a semiconductor substrate of a group III nitride with low defect density and little warp, this invention provides a process comprising such steps of:forming a GaN layer2on a sapphire substrate1of the C face ((0001) face); forming a titanium film3thereon; heat-treating the substrate in an atmosphere containing hydrogen gas or a gas of a compound containing hydrogen to form voids in the GaN layer2;and thereafter forming a GaN layer4on the GaN layer2′.

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patent: A 2000-228539 (2000-08-01), None
Masaru Kuramoto et al., “Room-Temperature Continuous-Wave Operation of InGaN Multi-Quantum-Well Laser Diodes Grown on an n-GaN Substrate with a Backside n-Contact,”Jpn. J. Appl. Phys., V. 38, 1999, pp. L184-L186.
Tsvetanka S. Zheleva et al., Pendeo-Epitaxy—A New Approach for Lateral Growth of Gallium Nitride Structures,MRS Internet J. Nitride Semicond. Res., 4S1, G3.38, 1999, pp. 1-6.
Ok-Hyun Nam et al., “Lateral Epitaxy of Low Defect Density GaN Layers Via Organometallic Vapor Phase Epitaxy,”Appl. Phys. Lett., V. 71, 1997, pp. 1-3.

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