X-ray inspection system

X-ray or gamma ray systems or devices – Specific application – Absorption

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C378S189000, C378S197000

Reexamination Certificate

active

06968034

ABSTRACT:
An X-ray inspection system and methodology is disclosed. The system comprises a conveyor, an X-ray source that exposes an item under inspection to X-ray radiation and at least one X-ray detector that detects X-ray radiation modified by the item. The X-ray source and X-ray detector may be movable in any of first and second dimensions. The X-ray source may also be moved in a third dimension to zoom in and out on regions of interest in the item order inspection. The system further comprises a controller that controls movement of the X-ray source and X-ray detector, independently of each other, in any of collinear and different directions, to provide a plurality of X-ray views of the item at varying examination angles of the X-ray radiation. A processor coupled to the controller may be configured to receive and process detection information from the X-ray detector and to provide processed information to an operator interface. The operator interface may also receive instructions from an operator input and provide the instructions to the controller.

REFERENCES:
patent: 5367552 (1994-11-01), Peschmann
patent: 5642393 (1997-06-01), Krug et al.
patent: 5699400 (1997-12-01), Lee et al.
patent: 5796802 (1998-08-01), Gordon
patent: 5970113 (1999-10-01), Crawford et al.
patent: 6028910 (2000-02-01), Kirchner et al.
patent: 6088423 (2000-07-01), Krug et al.
patent: 6200024 (2001-03-01), Negrelli
patent: 6218943 (2001-04-01), Ellenbogen
patent: 6359961 (2002-03-01), Aufrichtig et al.
patent: 6373917 (2002-04-01), Roder
patent: 6435715 (2002-08-01), Betz et al.
patent: 6442233 (2002-08-01), Grodzins et al.
patent: 6459760 (2002-10-01), D'Ambrosio
patent: 6463121 (2002-10-01), Milnes
patent: 6556653 (2003-04-01), Hussein
patent: 2002/0176531 (2002-11-01), McClelland et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

X-ray inspection system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with X-ray inspection system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray inspection system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3511675

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.