Extracted polarization intensity differential scattering for...

Details Extracted polarization intensity differential scattering for... Extracted polarization intensity differential scattering for...

2005-02-22

2005-02-22

Toatley Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

For size of particles

By particle light scattering

C356S339000, C356S340000, C356S342000, C356S343000, C356S365000

Reexamination Certificate

active

06859276

ABSTRACT:
A particle sizing method and apparatus of the PIDS type uses randomly polarized radiation to irradiate a particle sample. Portions of the resulting side scattering pattern are decomposed to simultaneously produce, for each decomposed portion, first and second linearly polarized beams of radiation in which the respective planes of polarization of the two beams are mutually perpendicular. Each of the polarized beams is focused onto a photodetector, and the respective photodetector outputs are differentiated to provide PIDS signals that are useful in calculating a particle size distribution for the sample.

REFERENCES:
patent: 4953978 (1990-09-01), Bott et al.
patent: 5056918 (1991-10-01), Bott et al.
patent: 5104221 (1992-04-01), Bott et al.
patent: 5229839 (1993-07-01), Hayashi et al.
patent: 6252658 (2001-06-01), Togawa et al.

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