Maintenance system for analyzing instrument

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C702S183000, C702S185000, C702S187000, C702S188000, C702S189000

Reexamination Certificate

active

06850868

ABSTRACT:
In a maintenance system for an analyzing instrument, a maintenance department remotely operates a first computer by a second computer to execute an initial inspection and a basic function inspection of the instrument. Then, an abnormality contained in the result information for every executed inspection is specified, and optimum maintenance information for solving the specified abnormality is searched in a server and extracted. Thereafter, the extracted maintenance information is sent to the first computer in the user side. Namely, an operator at the user side is only required to deal with the maintenance of the instrument in accordance with the maintenance information sent from the maintenance department.

REFERENCES:
patent: 3854125 (1974-12-01), Ehling et al.
patent: 4470304 (1984-09-01), Nusbickel et al.
patent: 5594663 (1997-01-01), Messaros et al.
patent: 5684945 (1997-11-01), Chen et al.
patent: 6192320 (2001-02-01), Margrey et al.
patent: 6324665 (2001-11-01), Fay
patent: 20010056335 (2001-12-01), Ikeda et al.
patent: 20020059030 (2002-05-01), Otworth et al.
patent: 20020095419 (2002-07-01), Parce
patent: 20020128786 (2002-09-01), Alexander

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Maintenance system for analyzing instrument does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Maintenance system for analyzing instrument, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Maintenance system for analyzing instrument will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3505653

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.