Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-02-22
2005-02-22
Assouad, Patrick (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S097000, C702S158000, C702S159000, C331S057000
Reexamination Certificate
active
06859744
ABSTRACT:
In a method and a device for carrying frequency synthesis, in particular in a distance measuring device based on the principle of evaluating the change over time in the phase of an electromagnetic radiation emitted by a radiation source and remitted by an object aimed at, a frequency, which is preferably furnished by a quartz oscillator, is regulated in a ring oscillator with N delay elements (V1, V2, V3, . . . , VN) to a desired first high frequency (F), which is used as a mixer frequency or as a modulation frequency. The signals at the N delay elements (V1, V2, V3, . . . , VN) are delivered to a multiplexer, which is switched over with a cadence that is equivalent to 2*N times the frequency of the low-frequency measurement signal to be evaluated to produce a modulation frequency or mixer frequency.
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Assouad Patrick
Leica Geosystems AG
West Jeffrey R
LandOfFree
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