Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Reexamination Certificate
2005-11-29
2005-11-29
Evans, F. L. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With raman type light scattering
Reexamination Certificate
active
06970239
ABSTRACT:
The methods and apparatus300disclosed herein concern Raman spectroscopy using metal coated nanocrystalline porous silicon substrates240, 340. In certain embodiments of the invention, porous silicon substrates110, 210may be formed by anodic etching in dilute hydrofluoric acid150. A thin coating of a Raman active metal, such as gold or silver, may be coated onto the porous silicon110, 210by cathodic electromigration or any known technique. The metal-coated substrate240, 340provides an extensive, metal rich environment for SERS, SERRS, hyper-Raman and/or CARS Raman spectroscopy. In certain embodiments of the invention, metal nanoparticles may be added to the metal-coated substrate240, 340to further enhance the Raman signals. Raman spectroscopy may be used to detect, identify and/or quantify a wide variety of analytes, using the disclosed methods and apparatus300.
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Berlin Andrew A.
Chan Selena
Yamakawa Mineo
DLA Piper Rudnick Gray Cary US LLP
Evans F. L.
Geisel Kara
Intel Corporation
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