Circuit for a focused ion beam (FIB) sensor

Details Circuit for a focused ion beam (FIB) sensor Circuit for a focused ion beam (FIB) sensor

Filed on

2005-11-15

Date issued

2005-11-15

Examiner

Paik, Steven S. (Department: 2876)

Patent Class

Registers

SubClass

Records

SubSubClass

Conductive

Other Related Categories

C235S451000, C250S492100

Type

Reexamination Certificate

Status

active

Patent number

06964378

Description

ABSTRACT:
A circuit is enabled to capacitively drive a memory cell (erasing, programming, and reading) via a capacitance. The capacitance is additionally present and isolates the antenna from the driver circuit of the memory cell. Charge accumulates on the antenna in the case of a FIB attack. The capacitance prevents the charge from flowing away, so that the voltage thus generated acts on the memory cell, which thus experiences a corresponding alteration of its charge state, which is detected. The capacitance can be implemented and realized in any conventional manner, such as any arbitrary capacitor structure of the circuit.

REFERENCES:
patent: 4814849 (1989-03-01), Schrenk
patent: 5434422 (1995-07-01), Iwamoto et al.
patent: 5656811 (1997-08-01), Itoh et al.
patent: 5844416 (1998-12-01), Campbell et al.
patent: 6404274 (2002-06-01), Hosono et al.
patent: 6452283 (2002-09-01), Smola et al.
patent: 6686623 (2004-02-01), Yamazaki
patent: 0 510 434 (1992-10-01), None
patent: 00/11719 (2000-03-01), None

Affiliated with

Also associated with

Rating

Circuit for a focused ion beam (FIB) sensor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Circuit for a focused ion beam (FIB) sensor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Circuit for a focused ion beam (FIB) sensor will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3495589