Semiconductor device testing apparatus and a test tray for...

Details Semiconductor device testing apparatus and a test tray for... Semiconductor device testing apparatus and a test tray for...

2005-02-15

2005-02-15

Decady, Albert (Department: 2133)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

Reexamination Certificate

active

06856128

ABSTRACT:
An IC tester which is capable of reducing the time required before completion of testing on all of ICs to be tested is provided. The depth (length in the Y-axis direction) of the constant temperature chamber4and the exit chamber5is expanded by a dimension corresponding approximately to one transverse width (length of the minor edge) of the rectangular test tray3, and two generally parallel test tray transport paths or alternatively a widened test tray transport path broad enough to transport two test trays simultaneously with the two test trays juxtaposed in a direction transverse to the widened test tray transport path are provided in the section of test tray transport path extending from the soak chamber41in the constant temperature chamber4through the testing section42in the constant temperature chamber4to the exit chamber5so that two test trays may be simultaneously transported along the two test tray transport paths or the widened test tray transport path.

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