Projection exposure device and position alignment device and...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Reexamination Certificate

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C355S053000, C355S077000, C382S151000

Reexamination Certificate

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06927854

ABSTRACT:
A mask mark is irradiated by an ultra-violet light source, thereby the image of the mark is passed through a lens and a half-mirror, then reflected by a mirror, thereafter further passed through a beam splitter and a lens, forming an image on a CCD. Then the center coordinate of the image is measured by a device, next, a board mark is illuminated by an infrared light source, and its image is passed through the mirror, the half-mirror, the beam splitter, a reflector, a lens, and a beam splitter, forming an image on a CCD. The positional alignment is implemented by moving the mobile stage in the XYθ directions based on the board mark on the infrared CCD and the mask mark on the ultra-violet CCD.

REFERENCES:
patent: 4641035 (1987-02-01), Suzuki et al.
patent: 4725737 (1988-02-01), Nakata et al.
patent: 5684565 (1997-11-01), Oshida et al.
patent: 5940528 (1999-08-01), Tanaka et al.
patent: 6760094 (2004-07-01), Shimada
patent: 6784979 (2004-08-01), Tajima et al.
patent: 6819406 (2004-11-01), Asami
patent: 6831730 (2004-12-01), Matsumoto et al.

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