Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-08-09
2005-08-09
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S066000, C702S069000, C702S124000
Reexamination Certificate
active
06928374
ABSTRACT:
Methods for displaying an anomaly in a periodic waveform. Specifically, in one embodiment according to the present invention, a method is provided of (a) setting a pulse start address, (b) setting an initial screen position, (c) displaying a pulse at a time-aligned position, (d) updating the pulse start address in response to a pulse width value, (e) repeating (c) and (d), and (f) interactively adjusting the pulse width value at any time without using a clock recovery procedure.
REFERENCES:
patent: 6137283 (2000-10-01), Williams et al.
patent: 6728648 (2004-04-01), Letts
patent: 6778931 (2004-08-01), Letts et al.
Lenihan Thomas F.
Moser Patterson & Sheridan LLP
Tektronix Inc.
Wachsman Hal
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