Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-11-08
2005-11-08
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C382S132000
Reexamination Certificate
active
06963811
ABSTRACT:
Disclosed are a method and system for processing timing information with respect to an electronic device. The method includes the steps of generating a first set of responses from the device at a first frequency in response to a first timing signal, and generating a second set of responses from the device at a second frequency in response to a second timing signal. The method includes the further steps of receiving the first and second sets of responses from the device, and processing the received responses to identify responses that are in synchronization with the first timing signal and responses that are in synchronization with the second timing signal. These timing signals may be related to clock signals applied to the electrical device, to clock signals internally generated by the device, or to extraneous noise that affects the electrical device in some fashion.
REFERENCES:
patent: 2003/0031353 (2003-02-01), Baertsch et al.
patent: 2003/0056154 (2003-03-01), Edwards et al.
patent: 2003/0141879 (2003-07-01), Wilsher
patent: 2003/0146768 (2003-08-01), Kash et al.
patent: 2003/0156750 (2003-08-01), Dajee et al.
International Business Machines - Corporation
Ludwin Richard M.
Nghiem Michael
Scully Scott Murphy & Presser
Sun Xiuqin
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