Sub-lithographics opening for back contact or back gate

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Junction field effect transistor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S347000, C257S352000, C438S517000

Reexamination Certificate

active

06972448

ABSTRACT:
A low resistance buried back contact for SOI devices. A trench is etched in an insulating layer at minimum lithographic dimension, and sidewalls are deposited in the trench to decrease its width to sublithographic dimension. Conducting material is deposited in the trench, which serves as a low-resistance contact to the back side of the device. In another embodiment, the trench-fill material is separated from the device by an insulating layer, and serves as a back gate structure.

REFERENCES:
patent: 5773331 (1998-06-01), Solomon et al.
patent: 6043535 (2000-03-01), Houston
patent: 6064589 (2000-05-01), Walker
patent: 6342717 (2002-01-01), Komatsu
patent: 6383904 (2002-05-01), Yu
patent: 6391695 (2002-05-01), Yu
patent: 6580132 (2003-06-01), Chan et al.
patent: 6759315 (2004-07-01), Furukawa et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Sub-lithographics opening for back contact or back gate does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Sub-lithographics opening for back contact or back gate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sub-lithographics opening for back contact or back gate will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3473972

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.