Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2005-08-30
2005-08-30
Nguyen, Van Thu (Department: 2824)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185140, C365S185220
Reexamination Certificate
active
06937520
ABSTRACT:
In a nonvolatile floating-gate semiconductor memory device, a word line voltage supply circuit is configured to be able to apply gate voltages to the same memory cells such that the gate voltage applied at and after the second time is different from the gate voltage applied at the first time. At least one of the word line voltage supply circuit and the bit line voltage supply circuit is set to be able to apply a voltage to the same memory cells for a longer application period at the first time than at and after the second time. With this configuration, the threshold voltage distribution of the memory cells is controlled to be narrow.
REFERENCES:
patent: 6166979 (2000-12-01), Miyamoto
patent: 6414893 (2002-07-01), Miyamoto
patent: 6459114 (2002-10-01), Nakamura et al.
patent: 6580643 (2003-06-01), Satoh et al.
patent: 2005/0024938 (2005-02-01), Ono et al.
patent: 11-134879 (1999-05-01), None
Giovanni Campardo, et al., “40-mm2 3-V-Only 50-Mhz 64-Mb 2-v/Cell CHE NOR Flash Memory”, IEEE Journal Of Solid-State Circuits, vol. 35, No. 11, Nov. 2000.
Hirano Yasuaki
Ono Tsuyoshi
Watanabe Masahiko
Wong Sau Ching
Harness & Dickey & Pierce P.L.C.
Nguyen Hien
Nguyen Van Thu
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