Apparatus and method for universally testing semiconductor...

Details Apparatus and method for universally testing semiconductor... Apparatus and method for universally testing semiconductor...

2005-10-04

2005-10-04

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

06952111

ABSTRACT:
An apparatus for testing a semiconductor device is disclosed. According to the present invention, the apparatus includes a pair of input pins, a first conductive wire, a second conductive wire, a driver and a terminator. A device-under-test (DUT) is connected to one of the pair of input pins. The first conductive wire and the second conductive wire are connected in parallel between the pair of input pins. The driver is coupled to the first conductive wire via a third conductive wire, and the terminator is coupled to the second conductive wire via a fourth conductive wire.

REFERENCES:
patent: 6087843 (2000-07-01), Pun et al.
patent: 6339338 (2002-01-01), Eldridge et al.
patent: 6356096 (2002-03-01), Takagi et al.
patent: 6771087 (2004-08-01), Oz et al.

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