Hybrid interface apparatus for testing integrated circuits...

Details Hybrid interface apparatus for testing integrated circuits... Hybrid interface apparatus for testing integrated circuits...

2005-10-25

2005-10-25

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755090, C439S066000, C439S083000

Reexamination Certificate

active

06958616

ABSTRACT:
A hybrid interface apparatus including a fixed base including a contact-locking structure supporting several spring-based contact members, and a nesting member slidably positioned over the fixed base and having a central test area that includes an array of through-holes that are aligned with upper ends of the contact members. To facilitate testing of ICs including both relatively low-speed general-purpose I/O structures and new high-speed I/O structures, the contact members mounted on the contact structure include both low-cost, relatively high-inductance contact members for facilitating communication with the general-purpose I/O structures of the IC, and relatively expensive, low-inductance contact members for facilitating high-speed communications with the high-speed I/O structures of the IC.

REFERENCES:
patent: 5185736 (1993-02-01), Tyrrell et al.
patent: 5639247 (1997-06-01), Johnson et al.
patent: 5955888 (1999-09-01), Frederickson et al.
patent: 6404211 (2002-06-01), Hamel et al.
patent: 6443745 (2002-09-01), Ellis et al.

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