Method of using a soft subpad for chemical mechanical polishing

Abrading – Abrading process – Glass or stone abrading

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Other Related Categories

C451S057000

Type

Reexamination Certificate

Status

active

Patent number

06908366

Description

ABSTRACT:
The present invention is directed to a method of modifying a wafer surface comprising providing a first abrasive article comprising a first three-dimensional fixed abrasive element and a first subpad generally coextensive with the first fixed abrasive element, contacting a surface of the first three-dimensional fixed abrasive element with a wafer surface, and relatively moving the first abrasive article and the wafer. The method additionally provides providing a second abrasive article comprising a second three-dimensional fixed abrasive element and a second subpad generally coextensive with the second fixed abrasive element, contacting a surface of the second three-dimensional fixed abrasive element with the wafer surface, and relatively moving the second abrasive article and the wafer. Wherein the first subpad has a deflection less than the deflection of the second subpad when measured 1.5 cm from the edge of a 1 kg weight, the weight having a contact area of 1.9 cm diameter.

REFERENCES:
patent: 4927432 (1990-05-01), Budinger et al.
patent: 5110843 (1992-05-01), Bries et al.
patent: 5152917 (1992-10-01), Pieper et al.
patent: 5514245 (1996-05-01), Doan et al.
patent: 5667541 (1997-09-01), Klun et al.
patent: 5692950 (1997-12-01), Rutherford et al.
patent: 5897426 (1999-04-01), Somekh
patent: 5913712 (1999-06-01), Molinar
patent: 5958794 (1999-09-01), Bruxvoort et al.
patent: 5968843 (1999-10-01), Dawson et al.
patent: 6007407 (1999-12-01), Rutherford et al.
patent: 6180020 (2001-01-01), Moriyama et al.
patent: 6194317 (2001-02-01), Kaisaki et al.
patent: 6231629 (2001-05-01), Christianson et al.
patent: 6234875 (2001-05-01), Pendergrass, Jr.
patent: 6383066 (2002-05-01), Chen et al.
patent: 6435942 (2002-08-01), Jin et al.
patent: 6461226 (2002-10-01), Yi
patent: 6620725 (2003-09-01), Shue et al.
patent: 2001/0051500 (2001-12-01), Homma et al.
patent: 2002/0002028 (2002-01-01), Torii et al.
patent: 2002/0004365 (2002-01-01), Jeong et al.
patent: 2002/0039880 (2002-04-01), Torii et al.
patent: 2002/0151253 (2002-10-01), Kollodge et al.
patent: 2002/0177386 (2002-11-01), Smith
patent: 2002/0192962 (2002-12-01), Miyashita et al.
patent: 0 874 390 (1998-10-01), None
patent: 1 050 369 (2000-11-01), None
patent: 1 077 108 (2001-02-01), None
patent: WO 99/06182 (1999-02-01), None
patent: WO 01/53042 (2001-07-01), None
patent: WO 02/062527 (2002-08-01), None
patent: WO 02/074490 (2002-09-01), None
ASTM-2240-97, Standard Test Method for Rubber Property—Durometer Hardness, Mar. 1997.
Volara® Type EO, Voltek Technical Data Sheet.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of using a soft subpad for chemical mechanical polishing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of using a soft subpad for chemical mechanical polishing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of using a soft subpad for chemical mechanical polishing will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3460862

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.