Semiconductor device testing apparatus and test method therefor

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S765010

Reexamination Certificate

active

06850860

ABSTRACT:
In a semiconductor device testing apparatus and test method, after a pass value and fail value corresponding respectively to an upper limit and a lower limit of a test range have been set, measurement is not performed at these positions, but measurement is performed by means of a binary search method from the next position.

REFERENCES:
patent: 3780274 (1973-12-01), Thompson et al.
patent: 4785235 (1988-11-01), Hendricks et al.
patent: 5894226 (1999-04-01), Koyama
patent: 5978573 (1999-11-01), Ohara
patent: 6014033 (2000-01-01), Fitzgerald et al.
patent: 6157935 (2000-12-01), Tran et al.
patent: 6282680 (2001-08-01), Takagi et al.
patent: 6320400 (2001-11-01), Black et al.
patent: 4-363675 (1992-12-01), None
patent: 9-152464 (1997-06-01), None
patent: 2760334 (1998-03-01), None
patent: 10-160798 (1998-06-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device testing apparatus and test method therefor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device testing apparatus and test method therefor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device testing apparatus and test method therefor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3454153

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.