Impedance sensing of flaws in non-homogenous materials

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324663, 324686, 324693, 324699, 324722, 324519, 324525, G01N 2702, G01R 2702

Patent

active

056024860

ABSTRACT:
An apparatus and method for sensing impedances of materials placed in contact therewith. The invention comprises a plurality of drive electrodes and one or more sense electrodes. Both rotating electric fields and differently shaped electric fields are provided for, as are analysis of structure and composition at different orientations and depths.

REFERENCES:
patent: 3676933 (1972-07-01), Slone
patent: 3730086 (1973-05-01), Dauterman
patent: 4074184 (1978-02-01), Dechene et al.
patent: 4166244 (1979-08-01), Woods et al.
patent: 4207141 (1980-06-01), Seymour
patent: 4426785 (1984-01-01), Loftus et al.
patent: 4429308 (1984-01-01), Shankle
patent: 4433332 (1984-02-01), Wason
patent: 4593244 (1986-06-01), Summers et al.
patent: 4623835 (1986-11-01), Mehdizadeh et al.
patent: 4677578 (1987-06-01), Wright et al.
patent: 4682105 (1987-07-01), Thorn
patent: 4862065 (1989-08-01), Pazda et al.
patent: 4958131 (1990-09-01), Thorn
patent: 4959040 (1990-09-01), Gardner et al.
patent: 4968947 (1990-11-01), Thorn
patent: 4972154 (1990-11-01), Bechtel et al.
patent: 4975645 (1990-12-01), Lucas
patent: 5001435 (1991-03-01), Smith
patent: 5095278 (1992-03-01), Hendrick
patent: 5130661 (1992-07-01), Beck et al.
patent: 5212452 (1993-05-01), Mayer et al.
patent: 5281921 (1994-01-01), Novak et al.
patent: 5394097 (1995-02-01), Bechtel et al.
Advertisement, strip-edge scanner, marketed by ABB Automation AB, Vasteras, Sweden, SR vol. 13 No. 2, 1993 (no month available).
Advertistement, rotary electrical contact assemblies by Rotocon, Meridian Laboratory, Middleton, Wisconsin (no date available).
Shadwell, P. W. and Daniels, D. J. "Critical Survey of Non-Destructive Testing Techniques for Non Conducting Materials." ERA Technology Limited, ERA Report 92-01-9R, May 1992.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Impedance sensing of flaws in non-homogenous materials does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Impedance sensing of flaws in non-homogenous materials, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Impedance sensing of flaws in non-homogenous materials will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-345090

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.