Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-03-08
2005-03-08
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S072500, C324S149000
Reexamination Certificate
active
06864694
ABSTRACT:
A voltage probe includes a signal lead that is configured to be soldered to a probing location in a device that is to be probed by the voltage probe, and a first cable that is coupled to the signal lead and that is configured to conduct an output signal that is responsive to an input signal that is received by the signal lead from the device. The signal lead has a thermal conductivity of less than 200 Watts per meter Kelvin (W/mK). Methods and other systems for providing electrical connections to devices under test are disclosed.
REFERENCES:
patent: 5348397 (1994-09-01), Ferrari
patent: 6700079 (2004-03-01), Bogursky et al.
patent: 6724208 (2004-04-01), Matsunaga et al.
Agilent Technologie,s Inc.
Nguyen Vincent Q.
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