Scanning microscope and methods for wavelength-dependent...

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

Reexamination Certificate

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C250S216000, C250S201300

Reexamination Certificate

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06852967

ABSTRACT:
A scanning microscope for examination of a sample (31), having at least one optical component (89) that exhibits a wavelength-dependent characteristic and having an apparatus for wavelength-dependent detection that acquires measured values in at least two wavelength regions each characterized by a spectral width and a spectral position, is disclosed. The scanning microscope is characterized in that the wavelength-dependent characteristic of the at least one optical component (89) can be ascertained, can be at least temporarily stored in the form of a data set in a memory (49, 81), and can be considered upon acquisition and/or upon utilization of the measured values.

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patent: 6300639 (2001-10-01), Wiederhoeft
patent: 6555820 (2003-04-01), Tacke et al.
patent: 4330347 (1995-03-01), None
patent: 19902625 (1999-09-01), None
patent: 19829944 (2000-01-01), None
patent: 9507447 (1995-03-01), None
H.J. Tiziani et al.: “Three-dimensional image sensing by chromatic confocal microscopy” in Applied Optics; Apr. 1, 1994; pp. 1838-1843.

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