Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Reexamination Certificate
2005-08-16
2005-08-16
Rosasco, S. (Department: 1756)
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
C430S394000
Reexamination Certificate
active
06929887
ABSTRACT:
A new method of applying FSAF is provided that optimizes the distribution of the spatial frequency and the unification of the photolithographic exposure level. The FSAF are removed by an additional exposure, using a specially designed mask that contains erasing features at the location of the FSAF.
REFERENCES:
patent: 5242770 (1993-09-01), Chen et al.
patent: 5424154 (1995-06-01), Borodovsky
patent: 5821014 (1998-10-01), Chen et al.
patent: 6109775 (2000-08-01), Tripathi et al.
patent: 6197452 (2001-03-01), Matumoto
patent: 6218089 (2001-04-01), Pierrat
patent: 6387596 (2002-05-01), Cole et al.
“Resolution Enhancement Techniques in Optical Lithography,” by Alfred Kwok-Kit Wang, Tutorial Texts in Optical Engineering, Vol. TT47, SPIE Press, Copyright 2001.
Hwang Gue Wuu
Lin Burn-Jeng
Liu Ru-Gyn
Rosasco S.
Taiwan Semiconductor Manufacturing Co. Ltd.
Thomas Kayden Horstemeyer & Risley
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