Printable assist lines and the removal of such

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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C430S394000

Reexamination Certificate

active

06929887

ABSTRACT:
A new method of applying FSAF is provided that optimizes the distribution of the spatial frequency and the unification of the photolithographic exposure level. The FSAF are removed by an additional exposure, using a specially designed mask that contains erasing features at the location of the FSAF.

REFERENCES:
patent: 5242770 (1993-09-01), Chen et al.
patent: 5424154 (1995-06-01), Borodovsky
patent: 5821014 (1998-10-01), Chen et al.
patent: 6109775 (2000-08-01), Tripathi et al.
patent: 6197452 (2001-03-01), Matumoto
patent: 6218089 (2001-04-01), Pierrat
patent: 6387596 (2002-05-01), Cole et al.
“Resolution Enhancement Techniques in Optical Lithography,” by Alfred Kwok-Kit Wang, Tutorial Texts in Optical Engineering, Vol. TT47, SPIE Press, Copyright 2001.

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