Semiconductor test and burn-in apparatus provided with a...

Details Semiconductor test and burn-in apparatus provided with a... Semiconductor test and burn-in apparatus provided with a...

2005-07-26

2005-07-26

Nguyen, Truc (Department: 2833)

Electrical connectors

Jumper

C439S134000, C439S149000

Reexamination Certificate

active

06921288

ABSTRACT:
A semi-conductor module burn-in test apparatus having a plurality burn-in boards each of which is provided a plurality of module test sockets thereon and each test socket is coupled to an adjacent test socket by with a high current, open/short split power connector that can readily connected to or disconnected from said adjacent test socket by coupling together the power inputs of the adjacent sockets or uncoupling the previously coupled power inputs of adjacent sockets and thereby selectively altering the current carrying levels available to said adjacent test sockets.

REFERENCES:
patent: 2830353 (1958-04-01), Barlow
patent: 3917371 (1975-11-01), Hirokawa et al.
patent: 4147446 (1979-04-01), Frank, Jr.
patent: 5014002 (1991-05-01), Wiscombe et al.
patent: 6309246 (2001-10-01), Keaton et al.

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