Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2005-07-12
2005-07-12
Bali, Vikkram (Department: 2623)
Image analysis
Applications
Manufacturing or product inspection
C382S146000, C382S147000, C382S149000
Reexamination Certificate
active
06917699
ABSTRACT:
So as to perform high-precision position detection without performing pattern matching in the direction of rotation even when the object of detection involves a positional deviation in the direction of rotation, pattern matching between a reference image and a rotated image obtained by rotating this reference image is performed during registration, and then the difference between the measured value of the position obtained following rotation and the theoretical value of the position of the rotated image is retained as a calibration amount corresponding to the known angle of rotation. Upon detection, the measured value is detected by pattern matching between an image of the object of detection, which is detected by imaging the object of detection disposed in an attitude that includes a positional deviation in the direction of rotation, and a reference image; and this measured value is corrected by the calibration amount.
REFERENCES:
patent: 6259960 (2001-07-01), Inokuchi
patent: 6751361 (2004-06-01), Wagman
patent: 6842538 (2005-01-01), Lee et al.
Bali Vikkram
Kabushiki Kaisha Shinkawa
Koda & Androlia
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