Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2005-09-27
2005-09-27
Tran, M. (Department: 2818)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185180
Reexamination Certificate
active
06950348
ABSTRACT:
Non-volatile memory such as flash EEPROM has memory cells that may be programmed in parallel using a self-limiting programming technique. Individual cells have charge storage units that may be charged by hot electrons in a self-limiting manner. As the charge storage unit reaches the required level of charge, hot electrons are no longer generated, or are generated in reduced number. The level of charge at which hot electron generation stops is determined by the voltage applied to the cell. Thus, several cells may be programmed in parallel, each self-limiting at a charge level corresponding to the voltage applied.
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EPO/ISA, “Notificatioh of Transmittal of the International Search Report and the Written Opinion of the International Searching Authority, or the Declaration”, mailed in corresponding PCT/US2004/019347 on Jan. 24, 2005, 13 pages.
Parsons Hsue & de Runtz LLP
SanDisk Corporation
Tran M.
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