Spectrum measuring instrument

Details Spectrum measuring instrument Spectrum measuring instrument

2005-04-12

2005-04-12

Lauchman, Layla (Department: 2877)

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

C356S328000, C356S307000

Reexamination Certificate

active

06879395

ABSTRACT:
In a spectrum measuring instrument of the present invention, a detecting surface of a detector is a two-dimensional detecting surface and spectrum light coming out from a dispersing element and is irradiated to a region A on the detecting surface. Signal intensity at the regions on the detecting surface other than the region A where the spectrum light is irradiated, is subtracted from signal intensity on the region A. Consequently, it is possible to obtain an accurate spectrum intensity signal by processing a detection signal in such a manner that adverse effects of stray light generated inside the spectrum measuring instrument and unwanted light generated by reflection and diffraction occurring on the surface of a detecting element are removed.

REFERENCES:
patent: 4715712 (1987-12-01), Nogami
patent: 5128549 (1992-07-01), Kaye
patent: 0 167 750 (1986-01-01), None
patent: 0 449 442 (1991-10-01), None
patent: 0 652 423 (1995-05-01), None
patent: 54-132973 (1979-10-01), None
Shigeru, S. et al., “Multiwavelength Spectrophotometer,” Patent Abstracts of Japan, Japanese Patent Publication No. 56-057925, May 20, 1981, (1 sheet).
Makoto, W., “Multiple Wavelength Spectroscope Device,” Patent Abstracts of Japan, Japanese Patent Publication No. 58-178227, Oct. 19, 1983, (1 sheet).

Affiliated with

Also associated with

Rating

Spectrum measuring instrument does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Spectrum measuring instrument, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Spectrum measuring instrument will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3414290