Semiconductor testing device

Details Semiconductor testing device Semiconductor testing device

2005-04-19

2005-04-19

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C361S776000

Reexamination Certificate

active

06882169

ABSTRACT:
A semiconductor testing device is used for testing a semiconductor device which has at least one spherical connection terminal. The testing device includes an insulating substrate having an opening formed there in at a position corresponding to the position of the spherical connection terminal, and a contact member, formed on the insulating substrate, including a connection portion which is connected with the spherical connection terminal, at least the connection portion being deformable and extending into the opening.

REFERENCES:
patent: 4107836 (1978-08-01), Roberts
patent: 4121044 (1978-10-01), Hadersbeck et al.
patent: 4893172 (1990-01-01), Matsumoto et al.
patent: 4950173 (1990-08-01), Minemura et al.
patent: 5006792 (1991-04-01), Malhi et al.
patent: 5133495 (1992-07-01), Angulas et al.
patent: 5152695 (1992-10-01), Grabbe et al.
patent: 5518964 (1996-05-01), DiStefano et al.
patent: 5615824 (1997-04-01), Fjelstad et al.
patent: 5625298 (1997-04-01), Hirano et al.
patent: 5632631 (1997-05-01), Fjelstad et al.
patent: 5688716 (1997-11-01), DiStefano et al.
patent: 5706174 (1998-01-01), Distefano et al.
patent: 5723347 (1998-03-01), Hirano et al.
patent: 5801441 (1998-09-01), DiStefano et al.
patent: 5802699 (1998-09-01), Fjelstad et al.
patent: 5810609 (1998-09-01), Faraci et al.
patent: 5812378 (1998-09-01), Fjelstad et al.
patent: 5830782 (1998-11-01), Smith et al.
patent: 5880590 (1999-03-01), Desai et al.
patent: 5913109 (1999-06-01), Distefano et al.
patent: 5915977 (1999-06-01), Hembree et al.
patent: 5934914 (1999-08-01), Fjelstad et al.
patent: 5949246 (1999-09-01), Frankeny et al.
patent: 5959354 (1999-09-01), Smith et al.
patent: 5980270 (1999-11-01), Fjelstad et al.
patent: 5983492 (1999-11-01), Fjelstad
patent: 5985682 (1999-11-01), Higgins, III
patent: 5989936 (1999-11-01), Smith et al.
patent: 6012224 (2000-01-01), DiStefano et al.
patent: 6064576 (2000-05-01), Edwards et al.
patent: 6080603 (2000-06-01), Distefano et al.
patent: 6086386 (2000-07-01), Fjelstad et al.
patent: 6104087 (2000-08-01), DiStefano et al.
patent: 6117694 (2000-09-01), Smith et al.
patent: 6194291 (2001-02-01), DiStefano et al.
patent: 6205660 (2001-03-01), Fjelstad et al.
patent: 6228685 (2001-05-01), Beroz et al.
patent: 6229100 (2001-05-01), Fjelstad
patent: 6246249 (2001-06-01), Fukasawa et al.
patent: 6265765 (2001-07-01), DiStefano et al.
patent: 6285081 (2001-09-01), Jackson
patent: 6307260 (2001-10-01), Smith et al.
patent: 6361959 (2002-03-01), Beroz et al.
patent: 6370032 (2002-04-01), DiStefano et al.
patent: 6429112 (2002-08-01), Smith et al.
patent: 6499216 (2002-12-01), Fjelstad
patent: 20010000032 (2001-03-01), Smith et al.
patent: 20010022396 (2001-09-01), DiStefano et al.
patent: 20010050425 (2001-12-01), Beroz et al.
patent: 20020008966 (2002-01-01), Fjelstad et al.
patent: 20020068426 (2002-06-01), Fjelstad et al.
patent: 20020075016 (2002-06-01), Fjelstad
patent: 20020148639 (2002-10-01), Smith et al.
patent: 56-149786 (1981-11-01), None
patent: 1-125568 (1989-08-01), None
patent: 05175274 (1993-07-01), None
patent: 06120305 (1994-04-01), None
patent: 08227770 (1996-09-01), None
patent: 09055273 (1997-02-01), None
patent: 09232474 (1997-09-01), None
patent: 10079281 (1998-03-01), None
patent: 10208835 (1998-08-01), None

Affiliated with

Also associated with

Rating

Semiconductor testing device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor testing device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor testing device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3402481