Test pad array for contact resistance measuring of ACF bonds...

Details Test pad array for contact resistance measuring of ACF bonds... Test pad array for contact resistance measuring of ACF bonds...

2005-09-06

2005-09-06

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C349S149000

Reexamination Certificate

active

06940301

ABSTRACT:
A test pad array and dummy lead array for measuring anisotropic conductive film bond contact resistance on a liquid crystal display panel. The test pad and dummy lead arrays are provided on a surface of the liquid crystal display panel. The test pad array is electrically connected to a group of terminal pads disposed on the surface of the panel, which are electrically connected to an electronic device with anisotropic conductive film bonds. The test pad array allows the contact resistance of one or more of the anisotropic conductive film bonds to be measured on the panel. The dummy lead array is provided for electrically connecting a second electronic device to the panel. The dummy lead array is electrically connected to the test pad array such that a contact resistance of at least one anisotropic conductive film bond associated with the second electronic device can be measured on the panel using portions of the test pad array electrically connected to the dummy lead array.

REFERENCES:
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patent: 5748179 (1998-05-01), Ito et al.
patent: 6031590 (2000-02-01), Kim
patent: 6061246 (2000-05-01), Oh et al.
patent: 6344754 (2002-02-01), Tamani
patent: 6590624 (2003-07-01), Lee
patent: 6600543 (2003-07-01), Lee et al.
patent: 6777973 (2004-08-01), Morishita

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